Design for Test (DFT) in the semiconductor industry is a set of techniques and methodologies used during the design phase of integrated circuits (ICs) to ensure that they can be easily and effectively tested during the manufacturing process. The goal of DFT is to identify and eliminate potential manufacturing defects before the ICs are shipped to customers. Some common DFT techniques include built-in self-test (BIST), scan testing, boundary scan testing, and memory built-in self-test (MBIST). These techniques involve adding testability features to the design, such as test points, additional circuitry, and test patterns. By incorporating DFT into the design process, manufacturers can improve product quality, reduce manufacturing costs, and shorten time-to-market. DFT is an important part of the semiconductor industry, particularly as the complexity of ICs continues to increase.